TY  - BOOK
AU  - Chen, Chihau
ED  - Joint Workshop on Pattern Recognition and Artificial Intelligence
TI  - Pattern recognition and artifical intelligence
SN  - 0-12-170950-7
AV  - Q 334 J64
PY  - 1976///
CY  - New York
PB  - Academic
KW  - Inteligencia artificial
KW  - Gongresos
KW  - Modelos -
KW  - Reconocimiento -
KW  - Congresos
N1  - Incluye índice
ER  -