| 000 | 00869nam-a2200301-a-4500 | ||
|---|---|---|---|
| 005 | 20240105142232.0 | ||
| 008 | 000904s1998 enka rb 001 0 eng d | ||
| 010 | _a00302869 | ||
| 020 | _a0852969228 | ||
| 035 | _a253101 | ||
| 035 | _aUIA0198137 | ||
| 040 |
_aUIASF _bspa _cUIASF |
||
| 050 | 4 |
_aTK 7871.15.S55 _bP73.1998 |
|
| 245 | 0 | 0 |
_aProperties of amorphous silicon and its alloys / _cedited by Tim Searle. |
| 260 |
_aLondon : _bINSPEC, The Institute of Electrical Engineers, _c1998. |
||
| 300 |
_axiv, 412 p. : _bil. ; _c28 cm. |
||
| 440 | 0 | _aEMIS datareviews series | |
| 504 | _aIncluye referencias bibliográficas e índice. | ||
| 650 | 4 | _aSilicio | |
| 650 | 4 | _aAleaciones de silicio. | |
| 650 | 4 | _aSemiconductores amorfos. | |
| 700 | _aSearle, Tim | ||
| 905 | _a01 | ||
| 942 | _cNEWBFXC1 | ||
| 999 |
_c190226 _d190226 |
||
| 980 |
_851 _gRonald RUIZ |
||