000 | 01017nam-a2200313-a-4500 | ||
---|---|---|---|
005 | 20240105142346.0 | ||
008 | 001123s1998 nyua rb 000 0 eng d | ||
010 | _a97039270 | ||
020 | _a0471143286 (cloth : alk. paper) | ||
035 | _a256844 | ||
035 | _aUIA0200989 | ||
040 |
_aDLC _bspa _cUIASF _dUIASF |
||
050 | 4 |
_aTS 173 _bM44.1998 |
|
082 | 0 | 4 |
_a620/.00452 _221 |
100 | _aMeeker, William Q | ||
245 | 1 | 0 |
_aStatistical methods for reliability data / _cWilliam Q. Meeker, Luis A. Escobar. |
260 |
_aNew York : _bJ. Wiley, _c1998. |
||
300 |
_axxii, 680 p. : _bil. ; _c24 cm. |
||
440 | 0 |
_aWiley series in probability and statistics. _pApplied probability and statistics |
|
500 | _a"A Wiley-Interscience publication." | ||
504 | _aIncluye referencias bibliográficas (p. 645-663) e índices. | ||
650 | 4 |
_aConfiabilidad (Ingeniería) _xMétodos estadísticos. |
|
700 | _aEscobar, Luis A | ||
905 | _a01 | ||
942 | 1 | _cNEWBFXC1 | |
999 |
_c192886 _d192886 |
||
980 |
_851 _gRonald RUIZ |