000 | 00921cam-a2200337-a-4500 | ||
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001 | 000024354 | ||
005 | 20240105130551.0 | ||
008 | 910109t19781978ne r 000 0 fre d | ||
020 | _a0-44-85130-5 | ||
035 | _a124612 | ||
035 | _aUIA0024354 | ||
040 |
_aUIASF _cUIASF |
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041 | 0 | _aFRE | |
050 | 4 |
_aTA 417.23 _bD54 |
|
245 | 0 | 0 |
_aDiffraction and imaging techniques / _cedited by S. Amelinckx, R. Gevers, J. Van Landuyt |
250 | _a2nd ed | ||
260 |
_aAmsterdam : _bNorth-Holland, _cc1978 |
||
300 |
_av. ; _c23 cm |
||
504 | _aIncluye bibliografía e índice. | ||
505 | 1 | _aContenido: v.2. Imaging and diffraction techniques. | |
650 | 0 |
_aMicroscopía - _xCongresos |
|
650 | 0 |
_aElectrones - _xDifracción - _xCongresos |
|
700 | 1 | _aAmelinckx, Severin | |
700 | 1 | _aGevers, R | |
905 | _a01 | ||
942 | _cNEWBFXC1 | ||
999 |
_c24008 _d24008 |
||
980 |
_851 _gRonald RUIZ |