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001 000024354
005 20240105130551.0
008 910109t19781978ne r 000 0 fre d
020 _a0-44-85130-5
035 _a124612
035 _aUIA0024354
040 _aUIASF
_cUIASF
041 0 _aFRE
050 4 _aTA 417.23
_bD54
245 0 0 _aDiffraction and imaging techniques /
_cedited by S. Amelinckx, R. Gevers, J. Van Landuyt
250 _a2nd ed
260 _aAmsterdam :
_bNorth-Holland,
_cc1978
300 _av. ;
_c23 cm
504 _aIncluye bibliografía e índice.
505 1 _aContenido: v.2. Imaging and diffraction techniques.
650 0 _aMicroscopía -
_xCongresos
650 0 _aElectrones -
_xDifracción -
_xCongresos
700 1 _aAmelinckx, Severin
700 1 _aGevers, R
905 _a01
942 _cNEWBFXC1
999 _c24008
_d24008
980 _851
_gRonald RUIZ