| 000 | 00889cam-a2200277-a-4500 | ||
|---|---|---|---|
| 001 | 000024507 | ||
| 005 | 20240105130554.0 | ||
| 008 | 910208s1976 ne r 000 0 eng d | ||
| 035 | _a124620 | ||
| 035 | _aUIA0024507 | ||
| 040 |
_aUIASF _cUIASF |
||
| 041 | 0 | _aENG | |
| 050 | 4 |
_aQC 176.83 _bC48 |
|
| 245 | 0 | 0 |
_aCharacterization of epitaxial semiconductor films / _cedited by henry Kressel |
| 260 |
_aAmsterdam ; _aNew York : _bElsevier Scientific, _c1976 |
||
| 300 |
_axii, 216 p. : _bil. ; _c25 cm |
||
| 440 | 0 |
_aMethods and phenomena, their applications in science and technology ; _v2 |
|
| 500 | _a"Published as a special issue of Thin solid films, vol. 31, issues 1 and 2." | ||
| 504 | _aIncluye bibliografía. | ||
| 650 | 0 | _aPelículas delgadas. | |
| 650 | 0 | _aEpitaxia | |
| 650 | 0 | _aSemiconductores | |
| 700 | 1 | _aKressel, Henry | |
| 905 | _a01 | ||
| 942 |
_cNEWBFXC1 _2ddc |
||
| 999 |
_c24161 _d24161 |
||
| 980 |
_851 _gRonald RUIZ |
||