| 000 | 01286nam a2200397 i 4500 | ||
|---|---|---|---|
| 001 | 000682772 | ||
| 005 | 20240105152714.0 | ||
| 008 | 160713s2016 nyua rb 000 0 eng d | ||
| 010 | _a2008930122 | ||
| 020 | _a9780387095783 | ||
| 020 | _a0387095780 | ||
| 035 | _a412711 | ||
| 040 |
_aYDX _bspa _erda _cYDX _dUIASF |
||
| 050 | 4 |
_aQC 482.D5 _bP43.2016 |
|
| 100 | 1 |
_aPecharsky, Vitalij K. _eautor |
|
| 245 | 1 | 0 |
_aFundamentals of powder diffraction and structural characterization of materials / _cVitalij K. Pecharsky, Peter Y. Zavalij. |
| 250 | _a[Reimpresión]. | ||
| 264 | 1 |
_aNew York : _bSpringer, _c2016. |
|
| 300 |
_axxiii, 741 páginas : _bilustraciones ; _c24 cm |
||
| 336 |
_atexto _btxt _2rdacontent |
||
| 337 |
_asin mediación _bn _2rdamedia |
||
| 338 |
_avolumen _bnc _2rdacarrier |
||
| 504 | _aIncluye referencias bibliográficas. | ||
| 650 | 0 |
_aPowders _xOptical properties _xMeasurement. |
|
| 650 | 4 |
_aPolvos _xPropiedades ópticas _xMedición |
|
| 650 | 0 |
_aX-rays _xDiffraction _xMeasurement. |
|
| 650 | 4 |
_aRayos X _xDifracción _xMedición |
|
| 650 | 0 | _aX-ray crystallography. | |
| 650 | 4 | _aCristalografía por rayos X | |
| 700 | 1 |
_aZavalij, Peter Y. _eautor |
|
| 905 | _a01 | ||
| 942 | 1 | _cNEWBFXC1 | |
| 999 |
_c638555 _d638555 |
||
| 980 |
_851 _gRonald RUIZ |
||